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4th
Definitions of the
measuring task / Measuring layout |
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The
various positions
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Measuring layout
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Way of
measuring
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Instruments ( Levelmeter 2000 will automatically be recognized)
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Sensitivity (When using Levelmeter 2000 the sensitivity of the instruments
will automatically be detected and displayed)
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Limits
of variation
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Drift
admissible
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Drift
tolerance (only when drift admissible is activated)
can now be adapted to the required measuring task.
First
the actual measuring pattern must be changed according to the required
measuring layout. |
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A
number of possibilities are displayed:
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Line
measuring a simple line
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Line with twist
measuring a line with twist
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Parallels
measuring up to 3 parallel lines
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Parallels with twist
measuring up to 3 lines with twist
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Surface / measuring of surfaces respectively flatness
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Flatness
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Inclinations (squareness)
(measurement of squareness on objects
For measuring the flatness of a granite surface plate we chose <Surface>
/ [F5] |
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The
following selection of four different ways of measuring a flatness is
displayed:
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Rectangle
The alignment is done so that the two most outer points of the first
longitudinal line and the two most outer points of the first
transversal line are on the same height
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WYLER (Grid)
Standard layout for flatness measurement with a grid according to ISO
1101
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U-Jack
Mostly used in the US and in the UK. The biggest disadvantage compared
to the “Grid” method of WYLER’s DIN 876 / Part 1, is the fact that the
measured surface is not covered optimal
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Area (partial)
This figure is similar to the WYLER grid but has the option of
deactivate a number of segments not use
For our example we chose <WYLER> / [F1] |
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