4th Definitions of the measuring task / Measuring layout

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The various positions

  • Measuring layout

  • Way of measuring

  • Instruments ( Levelmeter 2000 will automatically be recognized)

  • Sensitivity (When using Levelmeter 2000 the sensitivity of the instruments will automatically be detected and displayed)

  • Limits of variation

  • Drift admissible

  • Drift tolerance (only when drift admissible is activated)
    can now be adapted to the required measuring task.

First the actual measuring pattern must be changed according to the required measuring layout.

A number of possibilities are displayed:

  • Line
    measuring a simple line

  • Line with twist
    measuring a line with twist

  • Parallels
    measuring up to 3 parallel lines

  • Parallels with twist
    measuring up to 3 lines with twist

  • Surface / measuring of surfaces respectively flatness

  • Flatness

    • Rectangle = alignment only according to “end-points”

    • U-Jack Alignement according to the US government specificationGGG-P-463c

  •  Inclinations (squareness)
    (measurement of squareness on objects


For measuring the flatness of a granite surface plate we chose <Surface> /  [F5]


The following selection of four different ways of measuring a flatness is displayed:
 

  • Rectangle
    The alignment is done so that the two most outer points of the first longitudinal line and the two most outer points of the first transversal line are on the same height

  • WYLER (Grid)
    Standard layout for flatness measurement with a grid according to ISO 1101

  • U-Jack
    Mostly used in the US and in the UK. The biggest disadvantage compared to the “Grid” method of WYLER’s DIN 876 / Part 1, is the fact that the measured surface is not covered optimal

  • Area (partial)
    This figure is similar to the WYLER grid but has the option of deactivate a number of segments not use

For our example we chose <WYLER>  /  [F1]