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COMPENDIUM INCLINATION MEASUREMENT
                                       WYLER AG, WINTERTHUR / SWITZERLAND

          6.4.2  COMMENTS ON  STEP LENGTH AND OVERLAP OF MEASUREMENTS

                  2  measurement
                   nd
          1  measurement    3  measurement    The individual measurements must always be
                            rd
           st
                                             overlapping, i.e. the starting point of the new
                                             measurement corresponds exactly to the endpoint
                                             of the previous measurement (see picture left).
                                              The measurement is always in the direction of
                                             the connector on the instrument.
                     Step length

        COMMENTS REGARDING DISPLAY ON MEASURING INSTRUMENT AND THE EFFECTIVE MEASUREMENT READING
                                                   Following the first measurement, the dis-
                                                 play on the instrument shows -4 μm/m. This
                                                 corresponds to a height difference of -4 μm
                                                 relative to a base length of 1000 mm.
                                                   Relative to a base length of  180 mm, the
                                                 height difference corresponds to -0.72 μm
                                                 only.
                                                   When measuring with a software, the va-
                                                 lue displayed is directly converted to the
                                                 step length and displayed.







        POSSIBLE  CAUSES OF MEASUREMENT ERRORS ARE:
          •  Temperature difference between the measuring base and the object to be measured
          •  Change in position of the object during the measurement, and/or vibrations
          • Careless measurement
          •  Dirty surface of the object to be measured
          •  The display on the instrument is not stabilized before pressing the remote release
          •  No resp. insufficient overlap in measurement
          •  Warped or worn measuring base
          •  “Short wave“ hump-like surface defects, which can not properly be captured by the measuring
            base provide no clear support (unstable measuring base means poor repetition)

         If these criteria, or conditions are not met, this affects the measurement uncertainty. The more accurate
        the measurement should be, the more time must be given to preparation and measurement.

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